When performing functional tests, keeping test times as short as possible is often a critical requirement. Time is money, after all. One way to reduce test times is to reduce the latency in setting up signal switch paths, stimulus devices, and measurements. These can all have a significant impact on the overall time it takes to complete a full functional test of a particular DUT.
Decreasing Test Time in High-Channel-Count Applications
Topics: automotive testing, Compliance Testing, defense testing, High channel count applications
AMETEK Introduces the RX0424, an All-New Rugged Accelerometer Instrument
AMETEK VTI's new RX0424 IEPE/Voltage Instrument is a cost-effective new device that is ideal for measuring acceleration forces and sensing static and dynamic movement or vibrations. Fully-integrated IEPE current excitation and tachometer input channels further enhance the instrument’s utility and functionality.
The RX0424’s precise signal path design delivers laboratory-grade measurements to the field. The RX4024 provides exceptional accuracy and repeatability by using independent 24-bit analog-to-digital converters at programmable data acquisition rates up to 204.8 kSa per second. Multiple input ranges help ensure that users capture all vibration events, large or small, and precision
The RX4024 connects directly to Integrated Electronic Piezoelectric (IEPE) transducers, which have a built-in charge amplifier or voltage amplifier. IEPE current excitation sources can be programmed to supply either 4.5 mA or 10 mA drive current. These sources can also be tailored to specific application demands.
Topics: Compliance Testing, defense testing
Topics: ATE, defense testing, FlexSys